A model for the mechanism of field interaction at silicon AFM tips in photon tunneling transfer
- 31 December 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 61 (1-4) , 85-89
- https://doi.org/10.1016/0304-3991(95)00125-5
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Piezoresistive cantilevers as optical sensors for scanning near-field microscopyUltramicroscopy, 1995
- Atomic force microscopy silicon tips as photon tunneling sensors: a resonant evanescent coupling experimentApplied Optics, 1995
- Microscopies de champ proche optique : application aux semiconducteursMicroscopy Microanalysis Microstructures, 1994
- Near-field optical microscope using a silicon-nitride probeApplied Physics Letters, 1993