Pulsed laser-induced photochemical decomposition of GaAs(110) studied with time-resolved photoelectron spectroscopy using synchrotron radiation
- 17 February 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 68 (7) , 1014-1017
- https://doi.org/10.1103/physrevlett.68.1014
Abstract
Cleaved GaAs surfaces decompose under weak pulsed-laser irradiation, leading to the formation of metallic Ga islands. The reduction of band bending nonuniformities in photoemission spectra acquired during the laser pulses, in concert with new core-level fitting techniques which treat broadened spectra, permits a detailed analysis. A decomposition rate consistent with a two-step photochemical excitation process is measured. The surface remains largely intact on an atomic scale, but is increasingly unable to support excited surface states as decomposition proceeds.Keywords
This publication has 12 references indexed in Scilit:
- GaAs(110) terrace-width distributions and kink formationPhysical Review B, 1991
- Potential-barrier measurements at clustered metal-semiconductor interfacesPhysical Review B, 1991
- Surface space-charge dynamics and surface recombination on silicon (111) surfaces measured with combined laser and synchrotron radiationPhysical Review Letters, 1990
- Photoemission Study of Low-Fluence, Non-Thermal Laser Damage of UHV-Cleaved Gallium Arsenide (110)MRS Proceedings, 1990
- Surface Intervalley Scattering on GaAs(110): Direct Observation with Picosecond Laser PhotoemissionPhysical Review Letters, 1989
- Kinetics of growth coalescence of In/GaAsJournal of Vacuum Science & Technology A, 1988
- Initial oxidation of GaAs(110): A core-level photoemission studyPhysical Review B, 1984
- Effects of vacuum annealing on the electronic properties of cleaved GaAsJournal of Physics C: Solid State Physics, 1983
- Three and four generalized Lorentzian approximations for the Voigt line shapeApplied Optics, 1981
- Optical heating in semiconductors: Laser damage in Ge, Si, InSb, and GaAsJournal of Applied Physics, 1980