Experimental adaptive optimization of mass spectrometer ion optic voltages using a genetic algorithm
- 1 May 1999
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 70 (5) , 2262-2267
- https://doi.org/10.1063/1.1149750
Abstract
We use a genetic algorithm (GA) to optimize the mass resolution and detection efficiency of a multi-photon ionization, time-of-flight mass spectrometer. The algorithm uses experimental fitness functions to optimize eight voltages supplied to a set of ion optics. The GA optimized the ion detection efficiency by a factor of 10 and the mass resolution by a factor of 11 over previous settings obtained from computer simulations of the instrument. This experiment highlights the usefulness of adaptive algorithms to the experimental optimization of multidimensional search problems commonly found in modern laboratories.Keywords
This publication has 19 references indexed in Scilit:
- Genetic algorithm optimization applied to electromagnetics: a reviewIEEE Transactions on Antennas and Propagation, 1997
- A hybrid technique for the optimal design of electromagnetic devices using direct search and genetic algorithmsIEEE Transactions on Magnetics, 1997
- Genetic algorithm coupled with a deterministic method for optimization in electromagneticsIEEE Transactions on Magnetics, 1997
- Mass Spectrometry: Recent Advances and Future DirectionsThe Journal of Physical Chemistry, 1996
- The effect of control field and measurement imprecision on laboratory feedback control of quantum systemsThe Journal of Chemical Physics, 1994
- Reflectron time-of-flight mass spectrometer for laser photodissociationReview of Scientific Instruments, 1992
- Reflectron time-of-flight mass spectrometry and laser excitation for the analysis of neutrals, ionized molecules and secondary fragmentsInternational Journal of Mass Spectrometry and Ion Processes, 1992
- High resolution time-of-flight mass spectrometers. Part III. Reflector designReview of Scientific Instruments, 1990
- High-resolution time-of-flight mass spectrometerReview of Scientific Instruments, 1989
- High-resolution time-of-flight mass spectrometers: Part I. Effects of field distortions in the vicinity of wire meshesReview of Scientific Instruments, 1989