Low-temperature thermometer using sputtered ZrNx thin film
- 1 December 1997
- journal article
- Published by Elsevier in Cryogenics
- Vol. 37 (12) , 817-822
- https://doi.org/10.1016/s0011-2275(97)00129-x
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Weak localization in thin films: a time-of-flight experiment with conduction electronsPublished by Elsevier ,2002
- Electrical Resistivity and High-Field Magnetoresistance of Zr-N Film ThermometersJapanese Journal of Applied Physics, 1992
- New type cryogenic thermometer using sputtered Zr-N filmsApplied Physics Letters, 1987
- Thin Film Thermometer for Cryogenic TemperatureJapanese Journal of Applied Physics, 1987
- Magnetoresistance of weakly disordered electronsPhysical Review B, 1982
- Cryogenic thermometry: a review of recent progress, IICryogenics, 1982
- Inelastic life-time of the conduction electrons in some noble metal filmsZeitschrift für Physik B Condensed Matter, 1982
- Characteristics of germanium thin film thermometers for use at low temperaturesCryogenics, 1982
- Maximum Metallic Resistance in Thin WiresPhysical Review Letters, 1977
- Low temperature, thin film NiCr thermometersReview of Scientific Instruments, 1974