Scanning tunneling microscopy on cleaved silicon pn junctions
- 7 January 2003
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Observation of p n junctions on implanted silicon using a scanning tunneling microscopeApplied Physics Letters, 1988
- Scanning tunneling microscopy and potentiometry on a semiconductor heterojunctionApplied Physics Letters, 1987
- Semiconductor device modelling from the numerical point of viewInternational Journal for Numerical Methods in Engineering, 1987
- STM applications for semiconductor materials and devicesSurface Science, 1987
- Tunneling through a controllable vacuum gapApplied Physics Letters, 1982