Quantitative Noncontact Electrostatic Force Imaging of Nanocrystal Polarizability
- 30 January 2003
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 107 (7) , 1525-1531
- https://doi.org/10.1021/jp0265438
Abstract
No abstract availableKeywords
This publication has 40 references indexed in Scilit:
- Switching of a ferroelectric polymer Langmuir–Blodgett film studied by electrostatic force microscopyJournal of Applied Physics, 2001
- Surface potential at surface-interface junctions inbicrystalsPhysical Review B, 2000
- Ferroelectric domain structures of PbTiO3studied by scanning force microscopyJournal of Physics D: Applied Physics, 2000
- Nanoscale variation in electric potential at oxide bicrystal and polycrystal interfacesSolid State Ionics, 2000
- Charging States of Si Quantum Dots as Detected by AFM/Kelvin Probe TechniqueJapanese Journal of Applied Physics, 2000
- Observation of electric field gradients near field-emission cathode arraysApplied Physics Letters, 1995
- Charge flow during metal-insulator contactPhysical Review B, 1992
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Observation of single charge carriers by force microscopyPhysical Review Letters, 1990
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987