Composition and wavelength dependence of the refractive index in Cd1−xMnxTe epitaxial layers

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Abstract
We have investigated Cd1−xMnxTe thin films with Mn concentrations of x=0.12, 0.18, 0.30, 0.52, and 0.70. These single crystal layers were grown by molecular beam epitaxy on [001] CdTe substrates. The real part of the refractive index, n, was determined below the band‐gap E0 in the range of 0.5–2.5 eV at T=300 K. The parallel reflectivity was measured near the Brewster angle at the YAG laser wavelength of 1.064 μm (hν=1.165 eV). Combining these results with the optical pathlength results (nd) of reflection measurements in a Fourier spectrometer we have determined n(x,ν) over a wide spectral range by utilizing a three parameter fit. The accuracy of these results for n should improve waveguide designs based on this material.