A model for proton-induced SEU
- 1 December 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 36 (6) , 2281-2286
- https://doi.org/10.1109/23.45436
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Verification of Single Event Upset Rate Estimation Methods with On-Orbit ObservationsIEEE Transactions on Nuclear Science, 1987
- Comparison of Soft Errors Induced by Heavy Ions and ProtonsIEEE Transactions on Nuclear Science, 1986
- Improved cross section calculations for astrophysical applicationsThe Astrophysical Journal Supplement Series, 1985
- Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test DataIEEE Transactions on Nuclear Science, 1983
- Microdosimetric Aspects of Proton-Induced Nuclear Reactions in Thin Layers of SiliconIEEE Transactions on Nuclear Science, 1982
- Partial Cross-Sections in High-Energy Nuclear Reactions, and Astrophysical Applications. I. Targets WITh Z <= 28. II. Targets Heavier than NickelThe Astrophysical Journal Supplement Series, 1973
- Monte Carlo Calculations of Nuclear Evaporation Processes. III. Applications to Low-Energy ReactionsPhysical Review B, 1959
- NUCLEAR LEVEL SPACINGSCanadian Journal of Physics, 1958
- Monte Carlo Calculations on Intranuclear Cascades. II. High-Energy Studies and Pion ProcessesPhysical Review B, 1958
- Statistics and Nuclear ReactionsPhysical Review B, 1937