New results of field-induced deformation of nematic liquid crystals for testing of digital integrated circuits
- 31 March 1994
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 24 (1-4) , 421-430
- https://doi.org/10.1016/0167-9317(94)90094-9
Abstract
No abstract availableKeywords
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