A universal test and maintenance controller for modules and boards
- 1 May 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Industrial Electronics
- Vol. 36 (2) , 231-240
- https://doi.org/10.1109/41.19074
Abstract
The design of a versatile module test and maintenance controller (MMC) is presented. Driven by structures test programs, an MMC is able to test every chip in a module or PCB via a test bus. More than one test bus can be controlled by an MMC, and can support several bus architectures and many modes of testing. The differences between MMCs on different modules are the test programs that they execute, the number of test buses they control, and the expansion units they use. A simple yet novel circuit, called a test channel, is used in an MMC. The MMC processor can control a test channel by reading/writing its internal registers. Once initialized by the MMC processor, a test channel can carry out most of the testing of a chip. Thus the processor need not deal with detailed test-bus control sequences since they are generated by the test channel. This strategy greatly simplifies the development of test programs. The proposed MMC can be implemented as a single-chip ASIC (application-specific integrated circuit) or by off-the-shelf components. Some of its self-test features are presented.<>Keywords
This publication has 9 references indexed in Scilit:
- A test and maintenance controller for a module containing testable chipsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A methodology for the design of hierarchically testable and maintainable digital systemsPublished by American Institute of Aeronautics and Astronautics (AIAA) ,1988
- Concurrent control of multiple BIT structuresPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1988
- Modular testprocessor for VLSI chips and high-density PC boardsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- Wavefront Array Processors-Concept to ImplementationComputer, 1987
- Selective I/O scan: A diagnosable design technique for VLSI systemsComputers & Mathematics with Applications, 1987
- Macro Testing: Unifying IC And Board TestIEEE Design & Test of Computers, 1986
- Built-In Self-Test TechniquesIEEE Design & Test of Computers, 1985
- LOCST: A Built-In Self-Test TechniqueIEEE Design & Test of Computers, 1984