Wide band gap amorphous silicon thin films prepared by chemical annealing
- 15 January 1999
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 85 (2) , 812-818
- https://doi.org/10.1063/1.369165
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
- In situ real time studies of the formation of polycrystalline silicon films on glass grown by a layer-by-layer techniqueApplied Physics Letters, 1995
- Roles of Atomic Hydrogen in Chemical AnnealingJapanese Journal of Applied Physics, 1995
- High-Quality Wide-Gap Hydrogenated Amorphous Silicon Fabricated Using Hydrogen Plasma Post-TreatmentJapanese Journal of Applied Physics, 1994
- Amorphous Silicon Alloy Photovoltaic Technology - from R&D to ProductionMRS Proceedings, 1994
- Relationship among mobility, recombination kinetics, and optimized solar cell performanceApplied Physics Letters, 1993
- Double-junction amorphous silicon-based solar cells with 11% stable efficiencyApplied Physics Letters, 1992
- A novel preparation technique for preparing hydrogenated amorphous silicon with a more rigid and stable Si networkApplied Physics Letters, 1991
- Narrow Band-Gap a-Si:H with Improved Minority Carrier-Transport Prepared by Chemical AnnealingJapanese Journal of Applied Physics, 1991
- Glow-discharge amorphous silicon: Growth process and structureMaterials Science Reports, 1987
- Reversible conductivity changes in discharge-produced amorphous SiApplied Physics Letters, 1977