Transistor noise parameter extraction using a 50 Omega measurement system

This publication has 16 references indexed in Scilit:

• Accuracy improvements in two-port noise parameter extraction method
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Designing FET's for broad noise circles
  IEEE Transactions on Microwave Theory and Techniques, 1993
• Design and characterization of high performance 60 GHz pseudomorphic MODFET LNAs in CPW-technology based on accurate S-parameter and noise models
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1992
• A temperature noise model for extrinsic FETs
  IEEE Transactions on Microwave Theory and Techniques, 1992
• FET noise model and on-wafer measurement of noise parameters
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1991
• Improvements to On-Wafer Noise Parameter Measurements
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1990
• Noise modeling and measurement techniques (HEMTs)
  IEEE Transactions on Microwave Theory and Techniques, 1988
• An Improved Computational Method for Noise Parameter Measurement
  IEEE Transactions on Microwave Theory and Techniques, 1979
• An efficient method for computer aided noise analysis of linear amplifier networks
  IEEE Transactions on Circuits and Systems, 1976
• Thermal Noise in Field-Effect Transistors
  Proceedings of the IRE, 1962