Improvements to On-Wafer Noise Parameter Measurements

This publication has 6 references indexed in Scilit:

• Achieving greater on-wafer S-parameter accuracy with the LRM calibration technique
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1989
• 2-26.5 GHZ On-Wafer Noise and S-Parameter Measurements Using a Solid State Tuner
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1989
• Results of a Multi-Site Round-Robin to Examine Probed Measurements of an Impedance Standard Substrate
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1989
• Accuracy improvements in microwave noise parameter measurements
  IEEE Transactions on Microwave Theory and Techniques, 1989
• New Millimeter Wave Noise Sources with High Reliability
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1987
• On the Measurement of Noise Parameters of Microwave Two-Ports (Short Paper)
  IEEE Transactions on Microwave Theory and Techniques, 1986