Characterization and modeling of MOS mismatch in analog CMOS technology

Publisher Website

19 November 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/icmts.1995.513967

Abstract

No abstract available

Keywords

This publication has 4 references indexed in Scilit:

On the relationship between topography and transistor matching in an analog CMOS technology
IEEE Transactions on Electron Devices, 1992
Characterisation and modeling of mismatch in MOS transistors for precision analog design
IEEE Journal of Solid-State Circuits, 1986
Matching properties, and voltage and temperature dependence of MOS capacitors
IEEE Journal of Solid-State Circuits, 1981
Linear Statistical Inference and its Applications
Published by Wiley ,1973