Measurements of leakage currents and the capacitance of the storage capacitor in a single DRAM cell
- 1 March 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 41 (3) , 391-397
- https://doi.org/10.1109/16.275225
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- Electrical characterization of textured interpoly capacitors for advanced stacked DRAMsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
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