The use of backscattered electrons for imaging purposes in a scanning electron microscope
- 1 January 1976
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 1 (3-4) , 231-238
- https://doi.org/10.1016/0304-3991(76)90037-1
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The origins of the secondary electron signal in scanning electron microscopyJournal of Physics D: Applied Physics, 1974
- Messungen der Winkelverteilung von Sekundärelektronen an dünnen freitragenden Al- und Au-SchichtenThe European Physical Journal A, 1972
- Visibility of Single AtomsScience, 1970
- Contribution of Backscattered Electrons to Secondary Electron FormationPhysical Review B, 1961
- Backscattering of Kilovolt Electrons from SolidsPhysical Review B, 1954
- Das Elektronen-RastermikroskopZeitschrift für Physik, 1938