Quantitative analysis of AlxGa1-xAs/GaAs multiquantum wells by means of AES depth profiling and small area XPS
- 1 June 1993
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 70-71, 89-93
- https://doi.org/10.1016/0169-4332(93)90404-y
Abstract
No abstract availableKeywords
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