Quantitative analysis of lateral force microscopy experiments
- 1 July 1996
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 67 (7) , 2560-2567
- https://doi.org/10.1063/1.1147214
Abstract
The analysis of lateral force microscopy experiments is discussed with emphasis on calibration issues and the statistical treatment of the original data in order to obtain reliable quantitative results. This includes an extensive discussion about the statistical and systematical errors which have to be considered if experimental results obtained under different experimental conditions (such as different cantilevers, samples, humidities, with or without lubricant, etc.) have to be compared. The proposed data analysis procedure is exemplified using data acquired on germanium sulfide and highly oriented pyrolytic graphite.Keywords
This publication has 24 references indexed in Scilit:
- Single-asperity friction in friction force microscopy: The composite-tip modelApplied Physics Letters, 1995
- Influence of water vapor on nanotribology studied by friction force microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1995
- Atomic scale friction and wear of micaSurface Science, 1995
- Influence of capillary condensation of water on nanotribology studied by force microscopyApplied Physics Letters, 1994
- Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscopeApplied Physics Letters, 1990
- Combined scanning force and friction microscopy of micaNanotechnology, 1990
- Improved fiber-optic interferometer for atomic force microscopyApplied Physics Letters, 1989
- An atomic-resolution atomic-force microscope implemented using an optical leverJournal of Applied Physics, 1989
- Novel optical approach to atomic force microscopyApplied Physics Letters, 1988
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987