Screening in modulation-doped quantum wells: Finite-thickness correction
- 15 August 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 44 (7) , 3340-3343
- https://doi.org/10.1103/physrevb.44.3340
Abstract
The electrostatic potential of a point charge screened by quantum-confined free carriers in a semiconductor heterostructure is calculated analytically, with inclusion of a spatial extension of the screening charge along the growth axis. The resulting expression is tested by computing numerically the binding energy of excitons between E2 and H1 subbands in a one-side modulation-doped quantum well, giving values in good agreement with experiment. The finite-thickness correction is 2.1 meV for a 150-Å quantum well with a carrier density of . It is found that the screening effect can be significantly reversed in wide wells with large carrier concentration due to the band-bending effect.
Keywords
This publication has 14 references indexed in Scilit:
- On the Fermi-Thomas screening of remote charges in quantised inversion layers at low temperaturesSemiconductor Science and Technology, 1990
- Exciton-one-component plasma interaction in high magnetic fieldsSurface Science, 1990
- Carrier-induced transition from excitonic to free-carrier-like radiative recombination in a semiconductor quantum well studied by magnetoluminescencePhysical Review B, 1989
- Linear and nonlinear optical properties of semiconductor quantum wellsAdvances in Physics, 1989
- Many-Body Effects in a Modulation-Doped Semiconductor Quantum WellPhysical Review Letters, 1987
- Spectroscopy of a high-mobility GaAs-As one-side-modulation-doped quantum wellPhysical Review B, 1986
- Screening of the electron-hole interaction in quantum well structuresSuperlattices and Microstructures, 1985
- Optical properties in modulation-doped GaAs-As quantum wellsPhysical Review B, 1985
- Screened Coulombic impurity bound states in semiconductor quantum wellsPhysical Review B, 1984
- Electronic properties of two-dimensional systemsReviews of Modern Physics, 1982