Segregation of copper in dilute aluminum - copper alloys
- 1 June 1994
- journal article
- Published by Elsevier in Scripta Metallurgica et Materialia
- Vol. 30 (12) , 1531-1534
- https://doi.org/10.1016/0956-716x(94)90303-4
Abstract
No abstract availableKeywords
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- The quantitative analysis of thin specimensJournal of Microscopy, 1975
- Inhibition of Electromigration Damage in Thin FilmsJournal of Vacuum Science and Technology, 1972
- Reduction of Electromigration in Aluminum Films by Copper DopingIBM Journal of Research and Development, 1970