Morphological fluctuations in discharge-produced μc-Si:H studied by small angle X-ray scattering
- 1 December 1983
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 59-60, 787-790
- https://doi.org/10.1016/0022-3093(83)90288-0
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Properties of heavily doped GDSi with low resistivityJournal of Non-Crystalline Solids, 1979