Toward VLSI Complexity : The DA Algorithm Scaling Problem : Can Special DA Hardware Help?
- 1 January 1982
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Built-in test for complex digital integrated circuitsIEEE Journal of Solid-State Circuits, 1980
- A Deductive Method for Simulating Faults in Logic CircuitsIEEE Transactions on Computers, 1972
- Fault-test analysis techniques based on logic simulationPublished by Association for Computing Machinery (ACM) ,1972
- An Algorithm for Path Connections and Its ApplicationsIEEE Transactions on Electronic Computers, 1961