Local structures and electrical properties of organic molecular films investigated by non-contact atomic force microscopy
- 1 March 2002
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 188 (3-4) , 391-398
- https://doi.org/10.1016/s0169-4332(01)00956-4
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
- Molecular Ferroelectricity of Vinylidene Fluoride Oligomer Investigated by Atomic Force MicroscopyJapanese Journal of Applied Physics, 2001
- Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force MicroscopyJapanese Journal of Applied Physics, 2001
- Structures and Ferroelectric Natures of Epitaxially Grown Vinylidene Fluoride Oligomer Thin FilmsJapanese Journal of Applied Physics, 2000
- Structures and Local Polarized Domains of Ferroelectric Organic Films Studied by Atomic Force MicroscopyJapanese Journal of Applied Physics, 1998
- Delocalization length, electronic properties and vibrational spectra of neutral α,α′ -dimethyl end-capped oligothiophenesSynthetic Metals, 1996
- Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)Japanese Journal of Applied Physics, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Imaging of Organic Molecules by Atomic Force MicroscopyJapanese Journal of Applied Physics, 1993
- Positioning single atoms with a scanning tunnelling microscopeNature, 1990
- Atomic Force MicroscopePhysical Review Letters, 1986