Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
- 1 April 1995
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 34 (4A) , L462-464
- https://doi.org/10.1143/jjap.34.l462
Abstract
Atomic-resolution imaging of a ZnSSe(110) surface grown by molecular beam epitaxy on a GaAs substrate was demonstrated for the first time with an ultrahigh-vacuum atomic force microscope (UHV-AFM). A rectangular lattice with spacing of 5.6±0.6 Å and 4.0±0.4 Å is resolved. This result suggests that the UHV-AFM has potential to image the group II-VI compound semiconductor surfaces having dangling bonds, on an atomic scale.Keywords
This publication has 16 references indexed in Scilit:
- Scanning force microscopy on the Si(111)7×7 surface reconstructionZeitschrift für Physik B Condensed Matter, 1994
- Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force MicroscopeJapanese Journal of Applied Physics, 1994
- Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force MicroscopyJapanese Journal of Applied Physics, 1993
- True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive ForcesScience, 1993
- Observation of Atomic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)Japanese Journal of Applied Physics, 1993
- Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuumUltramicroscopy, 1992
- Blue-green injection laser diodes in (Zn,Cd)Se/ZnSe quantum wellsApplied Physics Letters, 1991
- Atomic resolution on LiF (001) by atomic force microscopyZeitschrift für Physik B Condensed Matter, 1990
- Atomic Resolution with Atomic Force MicroscopeEurophysics Letters, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986