TRL Calibration Applied to the Measurement of Chip Transistor S-Parameters Up to 40 GHz
- 1 October 1990
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 214-219
- https://doi.org/10.1109/euma.1990.336046
Abstract
Peer ReviewedPostprint (published versionKeywords
This publication has 2 references indexed in Scilit:
- S-Parameters Measurement of Chip GaAs FETs up TO 22 GHz using the TRL Calibration TechniquePublished by Institute of Electrical and Electronics Engineers (IEEE) ,1989
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979