A reliability analysis of a k-out-of-N:G redundant system with the presence of chance common-cause shock failures
- 1 October 1992
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 32 (10) , 1395-1399
- https://doi.org/10.1016/0026-2714(92)90009-a
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Availability and frequency of failures of a system in the presence of chance common-cause shock failuresMicroelectronics Reliability, 1991
- Reliability analysis in the presence of chance common cause shock failuresMicroelectronics Reliability, 1991