Thin film surface studies by X-ray reflection
- 1 August 1970
- journal article
- Published by Elsevier in Surface Science
- Vol. 22 (1) , 173-186
- https://doi.org/10.1016/0039-6028(70)90032-4
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Characterization of thin film thickness and density by low angle X-ray interferenceMaterials Research Bulletin, 1967
- Adaptation of an X-Ray Diffractometer for Thin Film Studies by Total Reflection of X RaysReview of Scientific Instruments, 1964
- A New Device for measuring Thickness of Evaporated Metal Film by Use of X-ray Interference FringesJournal of the Physics Society Japan, 1959
- Density Measurements of Some Thin Copper FilmsJournal of Applied Physics, 1959
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954
- Dickenbestimmungen an dünnen Metallschichten durch optische Untersuchungen und RöntgenstrahlinterferenzenAnnalen der Physik, 1940
- Ein neues Interferenzsystem an best ubten SpiegelnThe European Physical Journal A, 1936
- Röntgenoptische Untersuchungen an dünnen NickelschichtenAnnalen der Physik, 1934
- Interferenz von Röntgenstrahlen an dünnen SchichtenAnnalen der Physik, 1931
- Untersuchungen zur Totalreflexion von RöntgenstrahlenAnnalen der Physik, 1931