Pull-down transient-imposed extrinsic base consideration in BiNMOS transistors
- 1 May 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 37 (5) , 1308-1313
- https://doi.org/10.1109/16.108193
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Turn-on transient analysis of a BiPMOS devicePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Delay analysis for BiCMOS driversPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Influence of device parameters on the switching speed of BiCMOS buffersIEEE Journal of Solid-State Circuits, 1989
- Two-dimensional transient analysis of a collector-up ECL inverterIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
- Two-dimensional analysis of a merged BiPMOS deviceIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1989
- Saturation currents in small-geometry bipolar transistorsIEEE Transactions on Electron Devices, 1984
- Bipolar transistor design for optimized power-delay logic circuitsIEEE Journal of Solid-State Circuits, 1979
- Auger coefficients for highly doped and highly excited siliconApplied Physics Letters, 1977
- Measurements of bandgap narrowing in Si bipolar transistorsSolid-State Electronics, 1976
- Two-dimensional computer simulation for switching a bipolar transistor out of saturationIEEE Transactions on Electron Devices, 1975