Study of basic mechanisms induced by an ionizing particle on simple structures
- 1 June 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 47 (3) , 519-526
- https://doi.org/10.1109/23.856474
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Semi-empirical modelization of charge funneling in a np diodePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Determination of key parameters for SEU occurrence using 3-D full cell SRAM simulationsIEEE Transactions on Nuclear Science, 1999
- Electric currents through ion tracks in silicon devicesIEEE Transactions on Nuclear Science, 1998
- SEU response of an entire SRAM cell simulated as one contiguous three dimensional device domainIEEE Transactions on Nuclear Science, 1998
- Charge collection from ion tracks in simple EPI diodesIEEE Transactions on Nuclear Science, 1997
- Device simulation of charge collection and single-event upsetIEEE Transactions on Nuclear Science, 1996
- Charge Funneling in N- and P-Type Si SubstratesIEEE Transactions on Nuclear Science, 1982