Determination of key parameters for SEU occurrence using 3-D full cell SRAM simulations
- 1 December 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 46 (6) , 1354-1362
- https://doi.org/10.1109/23.819093
Abstract
No abstract availableKeywords
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