Charge Transport by the Ion Shunt Effect
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 33 (6) , 1560-1564
- https://doi.org/10.1109/tns.1986.4334641
Abstract
Information on the quantity of charge transported between two junctions by the ion shunt effect is presented as a function of bias voltages and ionization densities.Keywords
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