Diagnosis oriented test pattern generation
- 1 January 1990
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 470-474
- https://doi.org/10.1109/edac.1990.136693
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- On the Acceleration of Test Generation AlgorithmsIEEE Transactions on Computers, 1983
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- PODEM-X: An Automatic Test Generation System for VLSI Logic StructuresPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1981
- Fault Folding for Irredundant and Redundant Combinational CircuitsIEEE Transactions on Computers, 1973
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967