Hyperfine characterization of tin-doped indium sesquioxide
- 1 September 1985
- journal article
- Published by Springer Nature in Hyperfine Interactions
- Vol. 23 (2) , 211-220
- https://doi.org/10.1007/bf02058077
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Temperature dependence of electron-capture aftereffects in the semiconductorPhysical Review B, 1984
- Kinetics studies and oxide characterization in the internal oxidation ofalloysPhysical Review B, 1983
- Time-differential perturbed angular-correlation-technique studies of internal oxidation of impurities in silverPhysical Review B, 1983
- Preparation and physical properties of transparent conducting oxide filmsPhysica Status Solidi (a), 1982
- X-ray photoemission spectroscopy studies of Sn-doped indium-oxide filmsJournal of Applied Physics, 1977
- Occurrence of corundum-type indium(III) oxide under ambient conditionsInorganic Chemistry, 1977
- Optical and electrical properties of doped In2O3 filmsPhysica Status Solidi (a), 1975
- Refinement of the crystal structure of In2O3 at two wavelengthsActa Crystallographica, 1966