Thickness measurements on layered materials in powder form by means of XPS and ion sputtering
- 1 February 1979
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 1 (1) , 26-31
- https://doi.org/10.1002/sia.740010106
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Oxide thickness measurements up to 120 Å on silicon and aluminum using the chemically shifted auger spectraSurface Science, 1977
- The use of X-ray photoelectron spectroscopy in corrosion scienceSurface Science, 1977
- Relative photoelectron signal intensities obtained with a magnesium x-ray sourceAnalytical Chemistry, 1975
- Instrumentation for surface studies: XPS angular distributionsJournal of Electron Spectroscopy and Related Phenomena, 1974
- Surface analysis and angular distributions in x-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1974
- Surface sensitivity and angular dependence of X-ray photoelectron spectraSurface Science, 1973