Residual stress in coated low-Z films oF TiC and TiN: I. Stress measurement by use of X-ray diffractometry
- 2 May 1984
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 123 (1-3) , 1309-1314
- https://doi.org/10.1016/0022-3115(84)90260-5
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Advanced materials for in-vessel componentsJournal of Nuclear Materials, 1982
- Characterization of TiB2 coated layer by X-ray lattice constant measurementJournal of Nuclear Materials, 1981
- Performance of Tic-coated graphite in electron beam tests and doublet III operationJournal of Nuclear Materials, 1981
- Process evaluation and characterization of TiC coating on graphite for doublet III limiters and neutral beam armorJournal of Nuclear Materials, 1981
- Thermal-shock- and fatigue-resistant coatings for magnetically confined fusion environmentsThin Solid Films, 1980
- Stresses in sputter-deposited nickel and copper oxide thin filmsThin Solid Films, 1979
- Intrinsic stress of magnetron-sputtered niobium filmsThin Solid Films, 1979
- Coatings for fusion reactor environmentsThin Solid Films, 1979
- Elastic Constants of TiC and TiB2Journal of Applied Physics, 1961