Efficient Statistical Modeling for Circuit Simulation

This publication has 5 references indexed in Scilit:

• Statistical IC simulation based on independent wafer extracted process parameters and experimental designs
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Realistic worst-case SPICE file extraction using BSIM3
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Relating statistical MOSFET model parameter variabilities to IC manufacturing process fluctuations enabling realistic worst case design
  IEEE Transactions on Semiconductor Manufacturing, 1994
• Statistical modeling for efficient parametric yield estimation of MOS VLSI circuits
  IEEE Transactions on Electron Devices, 1985
• The Simulation of MOS Integrated Circuits Using SPICE2
  Published by Defense Technical Information Center (DTIC) ,1980