Spectrally resolved photo depopulation of electron trapping defects in amorphous silica films
- 1 November 1970
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 8 (21) , 1669-1672
- https://doi.org/10.1016/0038-1098(70)90371-6
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- Model for Radiation-Induced Charge Trapping and Annealing in the Oxide Layer of MOS DevicesJournal of Applied Physics, 1969
- Kinetics and mechanism of thermal oxidation of silicon with special emphasis on impurity effectsJournal of Physics and Chemistry of Solids, 1969
- Electric fields at the surface and interface of SiO2 films on siliconSurface Science, 1969
- Photoemission of Electrons from-Type Degenerate Silicon into Silicon DioxidePhysical Review B, 1966
- Photoemission of Electrons from Silicon and Gold into Silicon DioxidePhysical Review B, 1966
- Photoemission of Electrons from Silicon into Silicon DioxidePhysical Review B, 1965
- Electronic Structure ofCenters: Saturation of the Electron Spin ResonancePhysical Review B, 1953