Interpretation of Analyses of Silicate Glasses and Minerals Obtained by Secondary‐Ion Mass Spectrometry
- 1 May 1985
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 68 (5) , C‐134-C‐135
- https://doi.org/10.1111/j.1151-2916.1985.tb15333.x
Abstract
A commercial floa olass was analyzed by secondary‐ion muss spectrometry. The depth profiles show important variations in the 40Ca+, 24Mg+, und 28Si+ ion intensities at the beginning of analyses, even on fresh fracture surfaces. Field‐induced migration of the ions or preferential sputtering cannot account for the observed variations in the secondary‐ion currents.Keywords
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