A New Type of Striation Observed in Electron-Micrographs of Sericite
- 1 March 1953
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 8 (2) , 149-151
- https://doi.org/10.1143/jpsj.8.149
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A New Type of Striation Observed in an ElectronmicrographJournal of the Physics Society Japan, 1951
- A Three-Stage Electron Microscope with Stereographic Dark Field, and Electron Diffraction CapabilitiesJournal of Applied Physics, 1950
- Über das primäre und sekundäre Bild im Elektronenmikroskop. II. Strukturuntersuchung mittels ElektronenbeugungAnnalen der Physik, 1936