Surface potential mapping: A qualitative material contrast in SPM
- 1 August 1997
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 69 (1) , 39-49
- https://doi.org/10.1016/s0304-3991(97)00027-2
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopyApplied Physics Letters, 1995
- Surface investigations with a Kelvin probe force microscopeUltramicroscopy, 1992
- Kelvin probe force microscopyApplied Physics Letters, 1991
- Scanning Tunneling Potentiometry/Spectroscopy (STP/STS)Japanese Journal of Applied Physics, 1989
- Extremely low-noise potentiometry with a scanning tunneling microscopeReview of Scientific Instruments, 1989
- Direct measurement of potential steps at grain boundaries in the presence of current flowPhysical Review Letters, 1988
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Scanning tunneling microscopy and potentiometry on a semiconductor heterojunctionApplied Physics Letters, 1987
- Scanning tunneling potentiometryApplied Physics Letters, 1986