Characteristic-impedance measurement error on lossy substrates

1 July 2001

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Microwave and Wireless Components Letters

Vol. 11 (7) , 299-301
https://doi.org/10.1109/7260.933777

Abstract

This paper examines error caused by parasitic inductance in the characteristic impedance measured by the calibration comparison method on lossy silicon substrates.

Keywords

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