Photoluminescence Spectra of Carbon Clusters Embedded in SiO2
- 1 February 1993
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 32 (2B) , L274
- https://doi.org/10.1143/jjap.32.l274
Abstract
Composite films of carbon and SiO2 were prepared by a rf cosputtering technique and their photoluminescence and absorption spectra were measured. A strong and broad photoluminescence peak located around 2.2 eV (visible to the naked eye) was observed for the samples with relatively low carbon concentrations. The blue shift of the photoluminescence peak observed with decreasing carbon concentration and the increased absorption in the UV region strongly suggest that carbon clusters comparable to or smaller than C60 formed in the SiO2 matrices are responsible for the strong photoluminescence.Keywords
This publication has 19 references indexed in Scilit:
- Microstructure of Visible Light Emitting Porous SiliconJapanese Journal of Applied Physics, 1992
- excitation: An alternate mechanism for porous Si photoluminescencePhysical Review B, 1992
- Self-trapped polaron exciton in neutral fullerenePhysical Review Letters, 1992
- Novel Process for Visible Light Emission from Si Prepared by Ion IrradiationJapanese Journal of Applied Physics, 1992
- Visible luminescence from silicon wafers subjected to stain etchesApplied Physics Letters, 1992
- The origin of visible luminescencefrom “porous silicon”: A new interpretationSolid State Communications, 1992
- Growth of Ge Microcrystals in SiO2 Thin Film Matrices: A Raman and Electron Microscopic StudyJapanese Journal of Applied Physics, 1991
- Characterization of the soluble all-carbon molecules C60 and C70The Journal of Physical Chemistry, 1990
- The infrared and ultraviolet absorption spectra of laboratory-produced carbon dust: evidence for the presence of the C60 moleculeChemical Physics Letters, 1990
- First- and second-order Raman scattering from finite-size crystals of graphitePhysical Review B, 1979