PIXE analysis of intermediate and thick targets via line intensity ratios
- 1 April 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 3 (1-3) , 203-205
- https://doi.org/10.1016/0168-583x(84)90363-x
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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