Simple depth profile determination by proton-induced x-ray emission
- 24 December 1975
- journal article
- other
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 131 (2) , 381-384
- https://doi.org/10.1016/0029-554x(75)90345-6
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Large-depth concentration-profile determination using γ rays proton-induced reactions: Development of a “global” methodNuclear Instruments and Methods, 1975
- Elemental trace analysis of small samples by proton induced x-ray emissionAnalytical Chemistry, 1975
- Ion-induced X-ray spectroscopy as a method to determine the depth distribution of trace elementsNuclear Instruments and Methods, 1975
- Proton-induced X-ray analysis of steel surfaces for microprobe purposesNuclear Instruments and Methods, 1975
- Depth profile determination by ion-induced X-ray spectroscopyNuclear Instruments and Methods, 1974
- Analysis of biological, clinical, and environmental samples using proton-induced x-ray emissionAnalytical Chemistry, 1974
- The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAsThin Solid Films, 1973
- Surface analysis using proton beamsThin Solid Films, 1973
- Full-range solution for the measurement of thin-film surface densities with proton-excited x raysJournal of Applied Physics, 1972
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970