Ion-induced X-ray spectroscopy as a method to determine the depth distribution of trace elements
- 15 February 1975
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 124 (1) , 143-147
- https://doi.org/10.1016/0029-554x(75)90395-x
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970