A systematic technique for detecting and locating bridging and stuck-at faults in I/O pins of LSI/VLSI chips
- 1 January 1987
- journal article
- Published by Elsevier in Computers & Mathematics with Applications
- Vol. 13 (5-6) , 461-474
- https://doi.org/10.1016/0898-1221(87)90076-9
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Detecting I/O and Internal Feedback Bridging FaultsIEEE Transactions on Computers, 1985
- Detection and Location of Input and Feedback Bridging Faults Among Input and Output LinesIEEE Transactions on Computers, 1980
- Test Generation for MicroprocessorsIEEE Transactions on Computers, 1980
- Undetectability of Bridging Faults and Validity of Stuck-At Fault Test SetsIEEE Transactions on Computers, 1980
- Bridging and Stuck-At FaultsIEEE Transactions on Computers, 1974