Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets

1 January 1980

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers

Vol. C-29 (1) , 55-59
https://doi.org/10.1109/tc.1980.1675457

Abstract

The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the advent of LSI technology. To date, only a very few papers have been published on this topic. Specifically, little is known regarding undetectable bridging faults. More importantly, what has yet to be explored are the effects of undetectable bridging faults on the tests designed to detect stuck-at faults.

Keywords

This publication has 11 references indexed in Scilit:

Detection of bridging faults in programmable logic arrays
Electronics Letters, 1992
Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor
IEEE Transactions on Computers, 1980
Optimal Detection of Bridge Faults and Stuck-At Faults in Two-Level Logic
IEEE Transactions on Computers, 1978
On the Properties of Irredundant Logic Networks
IEEE Transactions on Computers, 1976
Diagnosis & Reliable Design of Digital Systems
Published by Springer Nature ,1976
On the Design of Logic Networks with Redundancy and Testability Considerations
IEEE Transactions on Computers, 1974
Diagnosis of Short-Circuit Faults in Combinational Circuits
IEEE Transactions on Computers, 1974
Bridging and Stuck-At Faults
IEEE Transactions on Computers, 1974
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
IEEE Transactions on Computers, 1973
Fault Detection in Redundant Circuits
IEEE Transactions on Electronic Computers, 1967