RBS spectra for thin films with surface roughness
- 1 December 1992
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 72 (3-4) , 452-456
- https://doi.org/10.1016/0168-583x(92)95142-e
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- The shape of the ion backscattering spectrum for a surface having sine wave reliefNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1991
- Effects of random surface roughness in pixe analysis of thick targetsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
- R.B.S. Microscopic "Tomography"IEEE Transactions on Nuclear Science, 1983
- Energy loss, range, path length, time-of-flight, straggling, multiple scattering, and nuclear interaction probabilityAtomic Data and Nuclear Data Tables, 1982
- Effects of surface roughness on backscattering spectraNuclear Instruments and Methods, 1980
- Surface topology using rutherford backscatteringNuclear Instruments and Methods, 1980