Strong Flux Pinning by Cracks in Films of Superconducting Oxide

1 September 1988

journal article
Published by IOP Publishing in Japanese Journal of Applied Physics

Vol. 27 (9A) , L1712
https://doi.org/10.1143/jjap.27.l1712

Abstract

The possibility of flux pinning by cracks along basal planes in single-crystalline films of a superconducting oxide is theoretically investigated. For a single-crystalline film with thec-axis parallel to a substrate, the transport current can flow along the basal plane without an influence of the cracks, while the cracks act as strong pinning centers that prevent fluxoids from moving along thec-axis due to the Lorentz force. The critical current density in YBaCuO atT=77 K andB=5 T is estimated as 1.7×10¹⁰A/m²in the case of a mean interval of the cracks of 50 nm. This value is larger than that in Nb₃Sn at 4.2 K.

Keywords

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