Investigation of germanium films and GeSi interface structure by transmission electron microscopy
- 1 November 1975
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 30 (1) , 73-82
- https://doi.org/10.1016/0040-6090(75)90306-5
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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